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You are here: Home / Member’s Only Resources / Recorded Lectures

Recorded Lectures

CDP Spring 2020 meeting Agenda

CDP Virtual Agenda


Cluster 1: Processing


I-2: Search for High Performance Ferroelectrics and Piezoelectrics than can undergo Cold Sintering

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/I-2-Search-For-High-Performance-Ferroelectrics-And-Piezoelectrics-Than-Can-Undergo-Cold-Sintering-Cdp-2018-2-1-1.m4v

I-3: Updates to the Cold Sintering Process (Maria)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/I-3-Updates-to-the-Cold-Sintering-Process-CDP_2019_3.mp4

I-4: Designing Electroceramics with Ferroelectric Grain Boundaries and Cold Sintering (Randall)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/I-4-Designing-Electroceramics-with-Ferroelectric-Grain-Boundaries-and-Cold-Sintering-Randall-CDP_2019_2-1.mp4

I-5: Cold Sintering of Li ion Chemistries for Energy Storage Applications

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/I-5-Cold-Sintering-Of-Li-Ion-Chemistries-For-Energy-Storage-Applications-Cdp-2019-11-1.m4v

I-6: Cold Sintering of Piezoelectric Composites for Ultrasound Transducer Arrays (Trolier-McKinstry/Randall)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/I-6-Cold-Sintering-of-Piezoelectric-Composites-for-Ultrasound-Transducer-Arrays-CDP_2018_1-1.mp4

I-7: Inkjet Printing of Multilayer Capacitor Structures (Jur)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/I-7-Inkjet-Printing-of-Multilayer-Capacitor-Structures-Jur-CDP_2019_4.mp4

Cluster 2: Dielectrics


II-3: Defect Kinetics in Lead-free Ferroelectrics (Randall)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/II-3-Defect-Kinetics-in-Lead-free-Ferroelectrics-CDP_2019_10.mp4

II-4: Effects of Electrode Composition and Potential on Moisture Incorporation and Degradation of Dielectrics and Piezoelectrics (Dickey)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/Ii-4-Effects-Of-Electrode-Composition-And-Potential-On-Moisture-Incorporation-And-Degradation-Of-Dielectrics-And-Piezoelectrics-Dickey-Cdp-2019-5-1.m4v

II-5: Dielectric Characterization in the Microwave Frequency Range (Lanagan/Narayanan)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/Ii-5-Dielectric-Characterization-In-The-Microwave-Frequency-Range-Cdp-2018-3-1.m4v

II-6: Nucleation and Growth PEDOT Thin Films for Capacitor Device Systems (Parsons/Dickey)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/II-6-Nucleation-and-Growth-PEDOT-Thin-Films-for-Capacitor-Device-Systems-CDP_2018_4.mp4

II-7: Technique Development for Studying Origins of Fracture due to Inhomogeneous Stresses (Jones/Dickey)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/II-7-Technique-Development-for-Studying-Origins-of-Fracture-due-to-Inhomogeneous-Stresses-CDP_2018_6.mp4

Cluster 3: Films


III-2: Materials and Process Options for HfO2 Capacitors, Sensors and Ferroelectrics on Unique Substrates (Jones/Parsons)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/III-2-Materials-and-Process-Options-for-HfO2-Capacitors-Sensors-and-Ferroelectrics-on-Unique-Substrates-CDP_2019_6.mp4

III-3: Ferroelectrics Everywhere (Maria-seed project)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/Iii-3-Ferroelectrics-Everywhere-Maria-Seed-Project-1.m4v

III-4: Mechanical Reliability and Drift in PiezoMEMS CDP_2019_1 (Trolier-McKinstry)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/III-4-Mechanical-Reliability-and-Drift-in-PiezoMEMS-CDP_2019_1.mp4

III-5: The Effect of Imprint on Remanent Piezoelectric Properties and Ferroelectric Aging of PbZr0.52Ti0.48O3 Films (TrolierMcKinstry)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/III-5-The-Effect-of-Imprint-on-Remanent-Piezoelectric-Properties-and-Ferroelectric-Aging-of-PbZr0.52Ti0.48O3-Films-CDP_2018_5.mp4

III-6: Thermal Characterization of Dielectrics and Piezoelectrics(Choi/Trolier-McKinstry)

https://cdp.ncsu.edu/wp-content/uploads/sites/2/2020/05/III-6-Thermal-Characterization-of-Dielectrics-and-Piezoelectrics-CDP_2019_9.mp4

History of Ferroelectricity

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