Research:
Daniel’s research focus is on the electro-thermal analysis of gallium nitride (GaN) and gallium oxide (Ga2O3) electronic devices by utilizing Raman spectroscopy, thermoreflectance thermal imaging, infrared thermography, and coupled electro-thermal TCAD simulation. By combining these methods, he is able to study the effects of unique field plate technologies as well as correlate thermal and electrical effects to the reliability of light emitting diodes (LEDs).
Expected graduation date: Fall 2024